CIQTEK Highlights Advances in SEM Technology at MC2025, Germany

From August 24–29, 2025, CIQTEK participated in the Microscopy Conference 2025 (MC2025) held in Karlsruhe, Germany, one of Europe’s largest and most influential events in the field of electron microscopy. The conference attracted leading scientists, instrument developers, and industrial users, creating a dynamic platform for academic exchange and technological collaboration.

As part of the program, CIQTEK delivered an Exhibitor Presentation titled:
“Unlocking the Power of High-Speed Scanning Electron Microscopy — without Compromising Superb Imaging Resolution at Low kV.”

The presentation highlighted CIQTEK’s approach to enabling high-throughput SEM imaging while maintaining exceptional resolution at low accelerating voltages—a balance critical for applications in materials science, semiconductor failure analysis, and life sciences research. The talk generated considerable interest among attendees and sparked lively discussions about how advanced SEM systems can accelerate both fundamental research and industrial applications.

Beyond the presentation, the CIQTEK team actively engaged with researchers and industry professionals, sharing insights into the company’s broader electron microscopy portfolio and exploring opportunities for collaboration. These exchanges not only deepened awareness of CIQTEK’s technological strengths but also strengthened connections within the global microscopy community.

CIQTEK’s successful participation in MC2025 reflects its ongoing mission to push the boundaries of EM imaging technology and to provide researchers worldwide with powerful, accessible, and innovative solutions. Looking ahead, the company will continue to expand international partnerships and contribute to the advancement of microscopy-driven discovery.