Xi'an Jiaotong University Builds Advanced In-situ Materials Research Platform with CIQTEK Field Emission SEM
Xi'an Jiaotong University Builds Advanced In-situ Materials Research Platform with CIQTEK Field Emission SEM
October 28, 2025
Cutting-edge research platform for micro/nanoscale material behavior studies
The Center for Micro/Nanoscale Behavior of Materials at Xi’an Jiaotong University (XJTU) has established a comprehensive in-situ materials performance research platform based on the CIQTEK SEM4000 Field Emission Scanning Electron Microscope (FE-SEM). By integrating multiple in-situ testing systems, the center has achieved remarkable progress in the application of in-situ SEM techniques and advanced materials science research.
Leading national research infrastructure
The XJTU Center for Micro/Nanoscale Behavior of Materials focuses on the structure–property relationship of materials at the micro/nanoscale. Since its establishment, the center has published over 410 high-impact papers, including in Nature and Science, demonstrating outstanding scientific output.
The center houses one of the most advanced in-situ materials performance research platforms in China, equipped with large-scale systems such as a Hitachi 300 kV environmental TEM with quantitative nanomechanical–thermal coupling capabilities and an environmental aberration-corrected TEM for atomic-scale in-situ studies of thermo-mechanical-gas interactions. Together, these instruments provide powerful technical support for frontier materials research.
In 2024, the center introduced the CIQTEK SEM4000 Field Emission Scanning Electron Microscope. Dr. Fan Chuanwei, equipment manager at the center, remarked:
“The resolution and stability of the CIQTEK SEM4000 perfectly meet our research demands. What impressed us most was the efficiency. It took less than four months from equipment installation to our first paper published using the system, and the entire process from procurement to operation and after-sales was highly efficient.”
Regarding customized services, Dr. Fan added:
“For our in-situ SEM experiments, CIQTEK tailored a real-time video recording module and designed customized adapter stages for various in-situ setups. The rapid response and flexibility of the CIQTEK team fully demonstrate their professional expertise.”
Integrated in-situ testing capabilities
The SEM4000 platform at XJTU has successfully integrated three core in-situ testing systems, forming a complete in-situ mechanical performance research capability.
Bruker Hysitron PI 89 Nanomechanical Test System – Enables nanoindentation, tensile, fracture, fatigue, and mechanical property mapping. It has been extensively used in micro/nanoscale mechanical testing of semiconductor devices, leading to significant results in semiconductor materials research.
KW In-situ Tensile Stage – Offers a loading range from 1 N to 5 kN and supports various grips, including standard compression/tension, compact tension, three-point bending, and fiber tensile testing. Combined with SEM imaging, it allows real-time correlation of mechanical data with microstructural evolution, providing critical insights into deformation mechanisms.
Custom In-situ Torsion Stage – Developed by Prof. Wei Xueyong’s team at the School of Instrument Science and Engineering, XJTU, this system enables torsional deformation studies under SEM observation, adding a unique capability to the research platform.
CIQTEK Field Emission SEM4000 at Xi'an Jiaotong University
Dr. Fan commented:
“The systems are well integrated with the SEM and easy to operate. Our researchers quickly became proficient, and these combined techniques have provided a wealth of valuable experimental data and scientific discoveries.”
SEM4000: Designed for in-situ excellence
The outstanding performance of SEM4000 in in-situ studies benefits from its purpose-built engineering design. According to CIQTEK engineers, the large chamber and long-travel stage provide ample space and stability for complex in-situ setups, which is a key advantage over conventional SEMs.
Its modular architecture, featuring 16 flange interfaces, allows flexible customization of vacuum ports and electrical feedthroughs for different in-situ devices. This design makes integration and system expansion remarkably straightforward.
In addition, the integrated in-situ video recording function enables continuous observation and recording of microstructural evolution during experiments, providing crucial data for dynamic process analysis and mechanism exploration.
Continuous innovation for future research
Looking ahead, the XJTU center plans several technology development initiatives based on the SEM4000 platform, reflecting strong confidence in the long-term advancement of CIQTEK scientific instruments.
“We plan to add in-situ heating and EBSD modules for high-temperature and EBSD observations. We also aim to extend our self-developed quantitative in-situ mechanical analysis software, which was originally developed for TEM, to SEM applications. Furthermore, we’re developing an ‘SEM AI Agent’ system to enable automated operation, image acquisition, and data processing through AI assistance,” said Dr. Fan.
“With these continuous improvements, we hope to achieve more breakthroughs in understanding micro/nanoscale material behavior while contributing to the progress and broader adoption of advanced domestic scientific instruments. With CIQTEK’s support, we are confident in realizing these goals.”
The collaboration between Xi'an Jiaotong University and CIQTEK demonstrates the strong potential and technological depth of CIQTEK's high-end scientific instruments in frontier research. From the first paper produced within four months to the successful integration of multiple in-situ testing systems, the CIQTEK SEM4000 has proven to be a cornerstone of XJTU’s advanced materials research platform, earning recognition from one of the nation’s leading research institutions.
Стабильный, универсальный, гибкий и эффективный The CIQTEK SEM4000X является стабильным, универсальным, гибким и эффективным сканирующий электронный микроскоп с полевой эмиссией (FE-SEM) Он достигает разрешения 1,8 нм при 1,0 кВ и легко справляется с задачами получения изображений высокого разрешения для различных типов образцов. Его можно модернизировать, добавив режим сверхвысокого замедления пучка для дальнейшего повышения разрешения при низком напряжении. Микроскоп использует многодетекторную технологию с внутриколонным детектором электронов (UD), способным регистрировать сигналы SE и BSE, обеспечивая высокое разрешение. Детектор электронов (LD), установленный в камере, включает в себя кристаллический сцинтиллятор и фотоумножители, обеспечивающие повышенную чувствительность и эффективность, что позволяет получать стереоскопические изображения превосходного качества. Удобный графический интерфейс пользователя включает в себя автоматизированные функции, такие как автоматическая регулировка яркости и контрастности, автофокусировка, автоматический стигматор и автоматическое выравнивание, что позволяет быстро получать изображения сверхвысокого разрешения.
Аналитический Шоттки Сканирующий электронный микроскоп с полевой эмиссией (FESEM) CIQTEK SEM4000Pro аналитическая модель FE-SEM, оснащенная высокояркой и долговечной полевой электронной пушкой Шоттки. Ее трехступенчатая конструкция электромагнитной линзы обеспечивает значительные преимущества в аналитических приложениях, таких как EDS / EDX, EBSD, WDS и т. д. Модель стандартно поставляется с режимом низкого вакуума и высокопроизводительным низковакуумным вторичным электронным детектором, а также выдвижным детектором обратно рассеянных электронов, что позволяет наблюдать за плохо проводящими или непроводящими образцами.
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